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Pan Stanford Series on the High-Tech of Biotech
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Result per page : 10 ,25 ,50 ,all

Bioluminescent Microbial Biosensors - Design, Construction, and Implementation
Bioluminescent Microbial Biosensors - Design, Construction, and Implementation by Gérald Thouand (University of Nantes, France), Robert S. Marks (Ben Gurion University of the Negev, Israel) $149.95
Electrochemical Biosensors
Electrochemical Biosensors by Serge Cosnier (Université Joseph Fourier, France) $149.95
Handbook of Enhanced Spectroscopy
Handbook of Enhanced Spectroscopy by Marc Lamy de la Chapelle (Université Paris 13, France), Nathalie Lidgi-Guigui (Université Paris 13, France), Pietro Gucciardi (CNR, Italy) $179.95
Nanoantenna - Plasmon Enhanced Spectroscopies for Biotechnological Applications
Nanoantenna - Plasmon Enhanced Spectroscopies for Biotechnological Applications by Marc Lamy de la Chapelle (Université Paris 13, France), Annemarie Pucci (Heidelberg University, Germany) $149.95
Nanomaterials for Water Management - Signal Amplification for Biosensing from Nanostructures
Nanomaterials for Water Management - Signal Amplification for Biosensing from Nanostructures by Ibrahim Abdulhalim (Ben-Gurion University of the Negev, Israel), Robert S. Marks (Ben Gurion University of the Negev, Israel) $169.95
Viral Diagnostics - Advances and Applications
Viral Diagnostics - Advances and Applications by Robert S. Marks (Ben Gurion University of the Negev, Israel), Leslie Lobel (Ben-Gurion University of the Negev, Israel), Amadou Sall (Institut Pasteur de Dakar, Senegal) $149.95
 
 
Highlights
Einstein Was Right!
Einstein Was Right! by Karl Hess (University of Illinois, USA)
Why Are We Conscious? - A Scientist’s Take on Consciousness and Extrasensory Perception
Why Are We Conscious? - A Scientist’s Take on Consciousness and Extrasensory Perception by David E. H. Jones
Nanomedicine in Cancer
Nanomedicine in Cancer by Lajos P. Balogh
Metrology and Diagnostic Techniques for Nanoelectronics
Metrology and Diagnostic Techniques for Nanoelectronics by Zhiyong Ma (Intel Corporation, USA), David G. Seiler (National Institute of Standards and Technology, USA)

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