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Highlights
Metrology and Diagnostic Techniques for Nanoelectronics
Metrology and Diagnostic Techniques for Nanoelectronics by Zhiyong Ma (Intel Corporation, USA), David G. Seiler (National Institute of Standards and Technology, USA)
Silicon Wet Bulk Micromachining for MEMS
Silicon Wet Bulk Micromachining for MEMS by Prem Pal (Indian Institute of Technology Hyderabad, India), Kazuo Sato (Nagoya University, Japan)
Einstein Was Right!
Einstein Was Right! by Karl Hess (University of Illinois, USA)
Tissue Phenomics - Profiling Cancer Patients for Treatment Decisions
Tissue Phenomics - Profiling Cancer Patients for Treatment Decisions by Gerd Binnig (Definiens AG, Germany), Ralf Huss (Definiens AG, Germany), Guenther Schmidt (Definiens AG, Germany)

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