Loading... Please wait...
 
Algebra
test
There are no products in this category.
 
 
Highlights
Handbook of Full-Field Optical Coherence Microscopy - Technology and Applications
Handbook of Full-Field Optical Coherence Microscopy - Technology and Applications by Arnaud Dubois (Institut D' Optique, France)
Metrology and Diagnostic Techniques for Nanoelectronics
Metrology and Diagnostic Techniques for Nanoelectronics by Zhiyong Ma (Intel Corporation, USA), David G. Seiler (National Institute of Standards and Technology, USA)
Integrated Nanodevice and Nanosystem Fabrication - Materials, Techniques, and New Opportunities
Integrated Nanodevice and Nanosystem Fabrication - Materials, Techniques, and New Opportunities by Simon Deleonibus (CEA Grenoble, France)
Einstein Was Right!
Einstein Was Right! by Karl Hess (University of Illinois, USA)

* First Name:
* Last Name:
* Email Address:
* Institution:
Department/Faculty:
Address :
* Country:
State/Province:
Zip/Postcode:
* Subjects of Interest :