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Highlights
Metrology and Diagnostic Techniques for Nanoelectronics
Metrology and Diagnostic Techniques for Nanoelectronics by Zhiyong Ma (Intel Corporation, USA), David G. Seiler (National Institute of Standards and Technology, USA)
Handbook of Full-Field Optical Coherence Microscopy - Technology and Applications
Handbook of Full-Field Optical Coherence Microscopy - Technology and Applications by Arnaud Dubois (Institut D' Optique, France)
Spin Chemical Physics of Graphene
Spin Chemical Physics of Graphene by Elena Sheka (Peoples' Friendship University of Russia, Russia)
Einstein Was Right!
Einstein Was Right! by Karl Hess (University of Illinois, USA)

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