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Geometry and Topology
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Highlights
Metrology and Diagnostic Techniques for Nanoelectronics
Metrology and Diagnostic Techniques for Nanoelectronics by Zhiyong Ma (Intel Corporation, USA), David G. Seiler (National Institute of Standards and Technology, USA)
Integrated Nanodevice and Nanosystem Fabrication - Materials, Techniques, and New Opportunities
Integrated Nanodevice and Nanosystem Fabrication - Materials, Techniques, and New Opportunities by Simon Deleonibus (CEA Grenoble, France)
An Introduction to Quantum Transport in Semiconductors
An Introduction to Quantum Transport in Semiconductors by David Ferry (Arizona State University, USA)
Chemical Exchange Saturation Transfer Imaging - Advances and Applications
Chemical Exchange Saturation Transfer Imaging - Advances and Applications by Michael T. McMahon (Johns Hopkins University and Kennedy Krieger Institute, USA), Assaf A. Gilad (Johns Hopkins University and Kennedy Krieger Institute, USA), Jeff W. M. Bulte (Johns Hopkins University and Kennedy Krieger Institute, USA), Peter C. M. van Zijl (Johns Hopkins University and Kennedy Krieger Institute, USA)

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