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Nanomechanics
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Elastic and Plastic Deformation of Carbon Nanotubes
Elastic and Plastic Deformation of Carbon Nanotubes by Hiroyuki Shima (University of Yamanashi, Japan), Motohiro Sato (Hokkaido University, Japan) $149.95
Excitonic and Vibrational Dynamics in Nanotechnology
Excitonic and Vibrational Dynamics in Nanotechnology by Svetlana Kilina (University of Washington, USA) $129.95
Fracture Nanomechanics
Fracture Nanomechanics by Takayuki Kitamura (Kyoto University, Japan), Takashi Sumigawa (Kyoto University, Japan), Hiroyuki Hirakata (Osaka University, Japan), Takahiro Shimada (Kyoto University, Japan) $179.95
Handbook of Micromechanics and Nanomechanics
Handbook of Micromechanics and Nanomechanics by Shaofan Li (University of California at Berkeley, USA), Xin-Lin Gao (The University of Texas at Dallas, USA) $500.00
Handbook of Nanoindentation - with Biological Applications
Handbook of Nanoindentation - with Biological Applications by Michelle L Oyen (University of Cambridge, UK) $149.95
Mechanical Properties of Nanocrystalline Materials
Mechanical Properties of Nanocrystalline Materials big_icon_textbook by James C. M. Li (University of Rochester, USA) $99.95
 
 
Highlights
Transformation Wave Physics - Electromagnetics, Elastodynamics, and Thermodynamics
Transformation Wave Physics - Electromagnetics, Elastodynamics, and Thermodynamics by Mohamed Farhat (KAUST, Saudi Arabia), Pai-Yen Chen (Intellectual Ventures, USA), Sebastien Guenneau (Institut Fresnel, France), Stefan Enoch (Institut Fresnel, France)
Handbook of Full-Field Optical Coherence Microscopy - Technology and Applications
Handbook of Full-Field Optical Coherence Microscopy - Technology and Applications by Arnaud Dubois (Institut D' Optique, France)
Spin Wave Confinement (Second Edition) - Propagating Waves
Spin Wave Confinement (Second Edition) - Propagating Waves by Sergej Demokritov (Westfälische Wilhelms-Universität Münster, Germany)
Metrology and Diagnostic Techniques for Nanoelectronics
Metrology and Diagnostic Techniques for Nanoelectronics by Zhiyong Ma (Intel Corporation, USA), David G. Seiler (National Institute of Standards and Technology, USA)

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