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Communications
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Highlights
Metrology and Diagnostic Techniques for Nanoelectronics
Metrology and Diagnostic Techniques for Nanoelectronics by Zhiyong Ma (Intel Corporation, USA), David G. Seiler (National Institute of Standards and Technology, USA)
Silicon Wet Bulk Micromachining for MEMS
Silicon Wet Bulk Micromachining for MEMS by Prem Pal (Indian Institute of Technology Hyderabad, India), Kazuo Sato (Nagoya University, Japan)
Nanomedicine in Cancer
Nanomedicine in Cancer by Lajos P. Balogh
Einstein Was Right!
Einstein Was Right! by Karl Hess (University of Illinois, USA)

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